Probe #1152e64a82 of ASUSTek P5KC Desktop Computer

Log: smartctl

/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Barracuda ATA V Device Model: ST380023A Serial Number: -- Firmware Version: 3.31 User Capacity: 80 026 361 856 bytes [80,0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 2 Local Time is: Tue Sep 1 18:51:55 2015 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 426) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 64) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 064 057 006 - 98596299 3 Spin_Up_Time PO---- 100 100 000 - 0 4 Start_Stop_Count -O--CK 100 100 020 - 123 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 23 7 Seek_Error_Rate POSR-- 079 060 030 - 99004156 9 Power_On_Hours -O--CK 025 025 000 - 65904 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 099 099 020 - 1507 194 Temperature_Celsius -O---K 050 070 000 - 50 195 Hardware_ECC_Recovered -O-RC- 064 057 000 - 98596299 197 Current_Pending_Sector -O--C- 100 100 000 - 1 198 Offline_Uncorrectable ----C- 100 100 000 - 1 199 UDMA_CRC_Error_Count -OSRCK 200 161 000 - 127 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: scsi error aborted command Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 873 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 873 occurred at disk power-on lifetime: 65498 hours (2729 days + 2 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f8 db 73 41 Error: UNC at LBA = 0x0173dbf8 = 24370168 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 d8 40 cf db 73 41 00 00:58:10.142 READ DMA c8 d8 40 9f 47 73 41 00 00:58:10.124 READ DMA ca d8 08 37 e6 6d 41 00 00:58:10.124 WRITE DMA ca d8 10 97 f0 fe 40 00 00:58:10.124 WRITE DMA ca d8 08 07 f5 60 40 00 00:58:10.124 WRITE DMA Error 872 occurred at disk power-on lifetime: 65498 hours (2729 days + 2 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f8 db 73 41 Error: UNC at LBA = 0x0173dbf8 = 24370168 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 d8 40 cf db 73 41 00 00:58:06.056 READ DMA c8 d8 40 5f 47 73 41 00 00:58:06.043 READ DMA ca d8 18 8f e0 6d 41 00 00:58:06.043 WRITE DMA ca d8 10 47 f4 60 40 00 00:58:06.043 WRITE DMA ca d8 08 37 00 5e 40 00 00:58:06.043 WRITE DMA Error 871 occurred at disk power-on lifetime: 65498 hours (2729 days + 2 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f8 db 73 41 Error: UNC at LBA = 0x0173dbf8 = 24370168 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 d8 40 cf db 73 41 00 00:58:02.004 READ DMA c8 d8 40 1f 47 73 41 00 00:58:01.966 READ DMA ca d8 80 c7 cd 9f 40 00 00:58:01.965 WRITE DMA ca d8 80 47 cd 9f 40 00 00:58:01.964 WRITE DMA ca d8 80 c7 cc 9f 40 00 00:58:01.963 WRITE DMA Error 870 occurred at disk power-on lifetime: 65498 hours (2729 days + 2 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f8 db 73 41 Error: UNC at LBA = 0x0173dbf8 = 24370168 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 d8 40 cf db 73 41 00 00:57:57.917 READ DMA c8 d8 40 df 46 73 41 00 00:57:57.885 READ DMA ca d8 80 c7 ca 9f 40 00 00:57:57.884 WRITE DMA ca d8 80 47 ca 9f 40 00 00:57:57.883 WRITE DMA ca d8 80 c7 c9 9f 40 00 00:57:57.882 WRITE DMA Error 869 occurred at disk power-on lifetime: 65498 hours (2729 days + 2 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 f8 db 73 41 Error: UNC at LBA = 0x0173dbf8 = 24370168 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 d8 40 cf db 73 41 00 00:57:53.731 READ DMA c8 d8 40 8f db 73 41 00 00:57:53.724 READ DMA ca d8 08 47 00 5e 40 00 00:57:53.637 WRITE DMA ca d8 08 37 ef 13 40 00 00:57:53.637 WRITE DMA ca d8 08 3f 00 5e 40 00 00:57:53.636 WRITE DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 65279 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported


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