/dev/nvme0n1 === START OF INFORMATION SECTION === Model Number: Samsung SSD 960 EVO 500GB Serial Number: -- Firmware Version: 3B7QCXE7 PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 500,107,862,016 [500 GB] Unallocated NVM Capacity: 0 Controller ID: 2 Number of Namespaces: 1 Namespace 1 Size/Capacity: 500,107,862,016 [500 GB] Namespace 1 Utilization: 7,958,257,664 [7.95 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Fri Feb 23 18:19:32 2018 UTC Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0007): Security Format Frmw_DL Optional NVM Commands (0x001f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 83 Celsius Critical Comp. Temp. Threshold: 85 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 6.04W - - 0 0 0 0 0 0 1 + 5.09W - - 1 1 1 1 0 0 2 + 4.08W - - 2 2 2 2 0 0 3 - 0.0400W - - 3 3 3 3 210 1500 4 - 0.0050W - - 4 4 4 4 2200 6000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02, NSID 0x1) Critical Warning: 0x00 Temperature: 22 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 12,333 [6.31 GB] Data Units Written: 187,957 [96.2 GB] Host Read Commands: 174,828 Host Write Commands: 1,504,186 Controller Busy Time: 5 Power Cycles: 65 Power On Hours: 357 Unsafe Shutdowns: 54 Media and Data Integrity Errors: 0 Error Information Log Entries: 4 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 22 Celsius Temperature Sensor 2: 25 Celsius Error Information (NVMe Log 0x01, max 64 entries) Num ErrCount SQId CmdId Status PELoc LBA NSID VS 0 4 0 0x003f 0x4212 0x028 0 - - 1 3 0 0x0053 0x4212 0x028 0 - - 2 2 0 0x0067 0x4212 0x028 0 - - 3 1 0 0x00a1 0x4212 0x028 0 - - /dev/sda === START OF INFORMATION SECTION === Device Model: Samsung SSD 860 PRO 512GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: RVM01B6Q User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Feb 23 18:19:32 2018 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 47 12 Power_Cycle_Count -O--CK 099 099 000 - 44 177 Wear_Leveling_Count PO--C- 100 100 000 - 0 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 078 071 000 - 22 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0 235 Unknown_Attribute -O--C- 099 099 000 - 39 241 Total_LBAs_Written -O--CK 099 099 000 - 135515041 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce-0xcf SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 22 Celsius Power Cycle Min/Max Temperature: 40/40 Celsius Lifetime Min/Max Temperature: -1/83 Celsius Lifetime Average Temperature: 55 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (71) Index Estimated Time Temperature Celsius 72 2018-02-22 21:00 21 ** 73 2018-02-22 21:10 21 ** 74 2018-02-22 21:20 22 *** 75 2018-02-22 21:30 22 *** 76 2018-02-22 21:40 22 *** 77 2018-02-22 21:50 23 **** 78 2018-02-22 22:00 23 **** 79 2018-02-22 22:10 22 *** ... ..( 3 skipped). .. *** 83 2018-02-22 22:50 22 *** 84 2018-02-22 23:00 24 ***** ... ..( 5 skipped). .. ***** 90 2018-02-23 00:00 24 ***** 91 2018-02-23 00:10 27 ******** 92 2018-02-23 00:20 ? - 93 2018-02-23 00:30 24 ***** ... ..( 29 skipped). .. ***** 123 2018-02-23 05:30 24 ***** 124 2018-02-23 05:40 23 **** 125 2018-02-23 05:50 24 ***** ... ..( 4 skipped). .. ***** 2 2018-02-23 06:40 24 ***** 3 2018-02-23 06:50 23 **** 4 2018-02-23 07:00 22 *** ... ..( 3 skipped). .. *** 8 2018-02-23 07:40 22 *** 9 2018-02-23 07:50 23 **** 10 2018-02-23 08:00 22 *** 11 2018-02-23 08:10 22 *** 12 2018-02-23 08:20 21 ** ... ..( 7 skipped). .. ** 20 2018-02-23 09:40 21 ** 21 2018-02-23 09:50 22 *** 22 2018-02-23 10:00 22 *** 23 2018-02-23 10:10 21 ** ... ..( 2 skipped). .. ** 26 2018-02-23 10:40 21 ** 27 2018-02-23 10:50 22 *** 28 2018-02-23 11:00 22 *** 29 2018-02-23 11:10 23 **** 30 2018-02-23 11:20 22 *** 31 2018-02-23 11:30 23 **** 32 2018-02-23 11:40 23 **** 33 2018-02-23 11:50 22 *** 34 2018-02-23 12:00 22 *** 35 2018-02-23 12:10 21 ** ... ..( 3 skipped). .. ** 39 2018-02-23 12:50 21 ** 40 2018-02-23 13:00 22 *** 41 2018-02-23 13:10 22 *** 42 2018-02-23 13:20 23 **** 43 2018-02-23 13:30 23 **** 44 2018-02-23 13:40 22 *** 45 2018-02-23 13:50 22 *** 46 2018-02-23 14:00 21 ** ... ..( 2 skipped). .. ** 49 2018-02-23 14:30 21 ** 50 2018-02-23 14:40 20 * 51 2018-02-23 14:50 21 ** 52 2018-02-23 15:00 22 *** 53 2018-02-23 15:10 21 ** 54 2018-02-23 15:20 21 ** 55 2018-02-23 15:30 20 * ... ..( 5 skipped). .. * 61 2018-02-23 16:30 20 * 62 2018-02-23 16:40 21 ** 63 2018-02-23 16:50 22 *** 64 2018-02-23 17:00 22 *** 65 2018-02-23 17:10 21 ** 66 2018-02-23 17:20 ? - 67 2018-02-23 17:30 21 ** 68 2018-02-23 17:40 21 ** 69 2018-02-23 17:50 22 *** 70 2018-02-23 18:00 ? - 71 2018-02-23 18:10 ? - SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 44 --- Lifetime Power-On Resets 0x01 0x010 4 47 --- Power-on Hours 0x01 0x018 6 135515041 --- Logical Sectors Written 0x01 0x020 6 1370295 --- Number of Write Commands 0x01 0x028 6 92722583 --- Logical Sectors Read 0x01 0x030 6 1347595 --- Number of Read Commands 0x01 0x038 6 2733000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 27 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 22 --- Current Temperature 0x05 0x020 1 83 --- Highest Temperature 0x05 0x028 1 -1 --- Lowest Temperature 0x05 0x058 1 55 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 139 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC