/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST380013AS Serial Number: -- Firmware Version: 3.18 User Capacity: 80 023 182 848 bytes [80,0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 2 Local Time is: Thu Jul 12 15:06:26 2018 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 34) The self-test routine was interrupted by the host with a hard or soft reset. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 58) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 069 046 006 - 197330250 3 Spin_Up_Time PO---- 098 097 000 - 0 4 Start_Stop_Count -O--CK 098 098 020 - 2083 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0 7 Seek_Error_Rate POSR-- 072 060 030 - 19392686 9 Power_On_Hours -O--CK 076 076 000 - 21304 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 088 088 020 - 12392 194 Temperature_Celsius -O---K 043 065 000 - 43 195 Hardware_ECC_Recovered -O-RC- 069 046 000 - 197330250 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 001 000 - 373 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 130 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 130 occurred at disk power-on lifetime: 20009 hours (833 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 21 21 af 6f e0 Error: UNC 33 sectors at LBA = 0x006faf21 = 7319329 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 00 af 6f e0 00 00:05:41.471 READ DMA c8 00 02 94 af 6f e0 00 00:05:37.568 READ DMA c8 00 00 00 af 6f e0 00 00:05:37.559 READ DMA c8 00 02 92 af 6f e0 00 00:05:33.559 READ DMA c8 00 00 00 af 6f e0 00 00:05:33.548 READ DMA Error 129 occurred at disk power-on lifetime: 20009 hours (833 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 21 21 af 6f e0 Error: UNC 33 sectors at LBA = 0x006faf21 = 7319329 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 00 af 6f e0 00 00:05:41.471 READ DMA c8 00 02 92 af 6f e0 00 00:05:37.568 READ DMA c8 00 00 00 af 6f e0 00 00:05:37.559 READ DMA c8 00 02 90 af 6f e0 00 00:05:33.559 READ DMA c8 00 00 00 af 6f e0 00 00:05:33.548 READ DMA Error 128 occurred at disk power-on lifetime: 20009 hours (833 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 21 21 af 6f e0 Error: UNC 33 sectors at LBA = 0x006faf21 = 7319329 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 00 af 6f e0 00 00:05:09.663 READ DMA c8 00 02 90 af 6f e0 00 00:05:37.568 READ DMA c8 00 00 00 af 6f e0 00 00:05:37.559 READ DMA c8 00 02 8e af 6f e0 00 00:05:33.559 READ DMA c8 00 00 00 af 6f e0 00 00:05:33.548 READ DMA Error 127 occurred at disk power-on lifetime: 20009 hours (833 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 21 21 af 6f e0 Error: UNC 33 sectors at LBA = 0x006faf21 = 7319329 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 00 af 6f e0 00 00:05:09.663 READ DMA c8 00 02 8e af 6f e0 00 00:05:09.654 READ DMA c8 00 00 00 af 6f e0 00 00:05:05.662 READ DMA c8 00 02 8c af 6f e0 00 00:05:33.559 READ DMA c8 00 00 00 af 6f e0 00 00:05:33.548 READ DMA Error 126 occurred at disk power-on lifetime: 20009 hours (833 days + 17 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 21 21 af 6f e0 Error: UNC 33 sectors at LBA = 0x006faf21 = 7319329 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 00 af 6f e0 00 00:05:09.663 READ DMA c8 00 02 8c af 6f e0 00 00:05:09.654 READ DMA c8 00 00 00 af 6f e0 00 00:05:05.662 READ DMA c8 00 02 8a af 6f e0 00 00:05:05.653 READ DMA c8 00 00 00 af 6f e0 00 00:05:01.644 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Interrupted (host reset) 20% 21181 - # 2 Short offline Aborted by host 60% 10818 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported